Digital Logic Design MCQs - Chapter 9
MSI and PLD Components Quiz Questions and Answers PDF - 7
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The Quiz: Multiplexing means transmitting a large number of information units over; "MSI and PLD Components" App Download iOS & Android (Free) with answers 1 line, 1 channel, many channels for online software engineering degrees. Study multiplexers quiz questions, download Amazon eBook (Free Sample) for computer majors.
MSI & PLD Components Questions & Answers PDF Download: MCQ Quiz 7
MCQ 31: Multiplexing means transmitting a large number of information units over
- 1 channel
- 1 line
- many channels
- both a and b
MCQ 32: An integrated circuit with internal logic gates connected through electronic fuses is called
- portable large device
- portable logic device
- programmable large device
- programmable logic device
MCQ 33: A circuit that compares two numbers and determine their magnitude is called
- height comparator
- size comparator
- comparator
- magnitude comparator
MCQ 34: Addition and subtraction can be combined in one circuit with one common binary is known as
- multiplier
- divider
- subtractor
- adder
MCQ 35: The problem of carrying propagation delay was resolved by
- 4bit adder
- parallel adder
- ripple carry adder
- carry look ahead
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Computer Architecture Mock Tests
Digital Logic Design Practice Questions
Computer Architecture MCQ with Answers
- Energy required per transistor is proportional to the product of the capacitive
- A stall is commonly known as
- Register $2 written by subtraction can be written in the instruction
- Routing algorithm can allow packets to use resources in increasing partial order,
- No of dies/300 mm or (30 cm) wafer for die which is
- Time between the occurrence of an error and the resulting failure is the
MSI & PLD Components MCQ Book Questions
- Energy required per transistor is proportional to the product of the capacitive
- A stall is commonly known as
- Register $2 written by subtraction can be written in the instruction
- Routing algorithm can allow packets to use resources in increasing partial order,
- No of dies/300 mm or (30 cm) wafer for die which is
- Time between the occurrence of an error and the resulting failure is the