Cost trends and analysis multiple choice questions (MCQs), cost trends and analysis quiz answers to learn CS courses for online computer science degree. Quantitative design and analysis MCQs with answers, cost trends and analysis quiz questions and answers for information technology masters programs. Learn what is computer architecture, performance measurement, computer types, performance and price analysis, cost trends and analysis test prep for cisco certifications.

Learn quantitative design and analysis test MCQs: no of good dies/wafer are called, with choices top line, bottom line, double line, and multiple line for information technology masters programs. Practice merit scholarships assessment test, online learning cost trends and analysis quiz questions for competitive assessment in computer science major .

MCQ: No of good dies/wafer are called

1. Top line
2. Bottom line
3. Double line
4. Multiple line

B

MCQ: No of dies/300 mm or (30 cm)wafer for die which is 1.5 cm on a side and for that die which is 1.0 cm on a side, would be

1. 370 & 640
2. 270 & 740
3. 270 & 750
4. 270 & 640

D

MCQ: Dies which are 1.5cm on a side and 1.0cm on a side, supposing a density of 0.031/per cm^2 and N is 13.5, will have die yielding

1. 0.4 and 0.66
2. 0.4 and 1.66
3. 1.4 and 0.66
4. 2.4 and 0.66

A

MCQ: A wafer is normally tested and is chopped into

1. Dies
2. Tri
3. Tabs
4. Tracks

A

MCQ: Cost of die can be calculated as

1. Cost of die= Cost of wafer\ Dies per wafer + Die yield
2. Cost of die= Cost of wafer\ Dies per wafer - Die yield
3. Cost of die= Cost of wafer\ Dies per wafer ? Die yield
4. Cost of die= Cost of wafer\ Dies per wafer \ Die yield

C